Yow-Jon Lin

According to our database, Yow-Jon Lin authored at least 4 papers between 2016 and 2018.

Collaborative distances:

• Dijkstra number of seven.
• Erdős number of six.

2018

Temperature-dependent hole transport for pentacene thin-film transistors with a SiO₂ gate dielectric modified by (NH₄)₂S_<i>x</i> treatment.

Yow-Jon Lin, Cheng-Chun Hung

Microelectron. Reliab., 2018

2017

Temperature dependence of current-voltage characteristics of MoS₂/Si devices prepared by the chemical vapor deposition method.

Ting-Hong Su, Chia-Hung Chiang, Yow-Jon Lin

Microelectron. Reliab., 2017

2016

Electrical conduction mechanisms in the temperature-dependent current-voltage characteristics of poly(3-hexylthiophene)/n-type Si devices.

Hong-Zhi Lin, Yow-Jon Lin

Microelectron. Reliab., 2016

Temperature-dependent resistive switching characteristics for Au/n-type CuAlO_x/heavily doped p-type Si devices.

Yow-Jon Lin, Yu-Ju Chu

Microelectron. Reliab., 2016