Yousuke Miyake

According to our database, Yousuke Miyake authored at least 16 papers between 2012 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

A 1-ps Bin Size 4.87-ps Resolution FPGA Time-to-Digital Converter Based on Phase Wrapping Sorting and Selection.

Poki Chen, Joshua Adiel Wijaya, Seiji Kajihara, Trio Adiono, Hsiang-Yu Chen, Ruei-Ting Wang, Yousuke Miyake

IEEE Access, 2022

On Correction of A Delay Value Using Ring-Oscillators for Aging Detection and Prediction.

Takaaki Kato, Yousuke Miyake, Seiji Kajihara

Proceedings of the IEEE 31st Asian Test Symposium, 2022

2020

High-Precision PLL Delay Matrix With Overclocking and Double Data Rate for Accurate FPGA Time-to-Digital Converters.

Poki Chen, Jian-Ting Lan, Ruei-Ting Wang, Nguyen My Qui, John Carl Joel Salao Marquez, Seiji Kajihara, Yousuke Miyake

IEEE Trans. Very Large Scale Integr. Syst., 2020

Innovative Test Practices in Asia.

Takeshi Iwasaki, Masao Aso, Haruji Futami, Satoshi Matsunaga, Yousuke Miyake, Takaaki Kato, Seiji Kajihara, Yukiya Miura, Smith Lai, Gavin Hung, Harry H. Chen, Haruo Kobayashi, Kazumi Hatayama

Proceedings of the 38th IEEE VLSI Test Symposium, 2020

Path Delay Measurement with Correction for Temperature And Voltage Variations.

Yousuke Miyake, Takaaki Kato, Seiji Kajihara

Proceedings of the IEEE International Test Conference in Asia, 2020

On-Chip Delay Measurement for Degradation Detection And Its Evaluation under Accelerated Life Test.

Yousuke Miyake, Takaaki Kato, Seiji Kajihara, Masao Aso, Haruji Futami, Satoshi Matsunaga, Yukiya Miura

Proceedings of the 26th IEEE International Symposium on On-Line Testing and Robust System Design, 2020

On Evaluation for Aging-Tolerant Ring Oscillators with Accelerated Life Test And Its Application to A Digital Sensor.

Masayuki Gondo, Yousuke Miyake, Takaaki Kato, Seiji Kajihara

Proceedings of the 29th IEEE Asian Test Symposium, 2020

2019

On-Chip Delay Measurement for In-Field Test of FPGAs.

Yousuke Miyake, Yasuo Sato, Seiji Kajihara

Proceedings of the 24th IEEE Pacific Rim International Symposium on Dependable Computing, 2019

A Selection Method of Ring Oscillators for An On-Chip Digital Temperature And Voltage Sensor.

Yousuke Miyake, Yasuo Sato, Seiji Kajihara

Proceedings of the IEEE International Test Conference in Asia, 2019

On-Chip Test Clock Validation Using A Time-to-Digital Converter in FPGAs.

Yousuke Miyake, Seiji Kajihara, Poki Chen

Proceedings of the IEEE International Test Conference in Asia, 2019

2017

On the effects of real time and contiguous measurement with a digital temperature and voltage sensor.

Yousuke Miyake, Yasuo Sato, Seiji Kajihara

Proceedings of the International Test Conference in Asia, 2017

2016

Temperature and Voltage Measurement for Field Test Using an Aging-Tolerant Monitor.

Yousuke Miyake, Yasuo Sato, Seiji Kajihara, Yukiya Miura

IEEE Trans. Very Large Scale Integr. Syst., 2016

2014

Reduction of NBTI-Induced Degradation on Ring Oscillators in FPGA.

Yasuo Sato, Masafumi Monden, Yousuke Miyake, Seiji Kajihara

Proceedings of the 20th IEEE Pacific Rim International Symposium on Dependable Computing, 2014

Temperature and Voltage Estimation Using Ring-Oscillator-Based Monitor for Field Test.

Yousuke Miyake, Yasuo Sato, Seiji Kajihara, Yukiya Miura

Proceedings of the 23rd IEEE Asian Test Symposium, 2014

An On-Chip Digital Environment Monitor for Field Test.

Seiji Kajihara, Yousuke Miyake, Yasuo Sato, Yukiya Miura

Proceedings of the 23rd IEEE Asian Test Symposium, 2014

2012

On-chip temperature and voltage measurement for field testing.

Yukiya Miura, Yasuo Sato, Yousuke Miyake, Seiji Kajihara

Proceedings of the 17th IEEE European Test Symposium, 2012