Youqi Ding

Orcid: 0000-0001-8873-572X

According to our database1, Youqi Ding authored at least 3 papers between 2023 and 2024.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

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PhD thesis 
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Links

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Bibliography

2024
De-Coupling Thermo-Migration from Electromigration Using a Dedicated Test Structure.
Proceedings of the IEEE International Reliability Physics Symposium, 2024

2023
Challenges for Interconnect Reliability: From Element to System Level.
Proceedings of the 2023 International Symposium on Physical Design, 2023

Thermomigration-induced void formation in Cu-interconnects - Assessment of main physical parameters.
Proceedings of the IEEE International Reliability Physics Symposium, 2023


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