Youngtaek Kim

Orcid: 0000-0003-1615-7582

According to our database1, Youngtaek Kim authored at least 15 papers between 2011 and 2024.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

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Links

On csauthors.net:

Bibliography

2024
Metis: Fast Automatic Distributed Training on Heterogeneous GPUs.
Proceedings of the 2024 USENIX Annual Technical Conference, 2024

13.1 A 35.4Gb/s/pin 16Gb GDDR7 with a Low-Power Clocking Architecture and PAM3 IO Circuitry.
Proceedings of the IEEE International Solid-State Circuits Conference, 2024

2022
Measuring and Explaining the Inter-Cluster Reliability of Multidimensional Projections.
IEEE Trans. Vis. Comput. Graph., 2022

A 24-Gb/s/Pin 8-Gb GDDR6 With a Half-Rate Daisy-Chain-Based Clocking Architecture and I/O Circuitry for Low-Noise Operation.
IEEE J. Solid State Circuits, 2022

Distortion-Aware Brushing for Interactive Cluster Analysis in Multidimensional Projections.
CoRR, 2022

VANT: A Visual Analytics System for Refining Parallel Corpora in Neural Machine Translation.
Proceedings of the 15th IEEE Pacific Visualization Symposium, 2022

2021
Githru: Visual Analytics for Understanding Software Development History Through Git Metadata Analysis.
IEEE Trans. Vis. Comput. Graph., 2021

Interactive Visualization for Exploring Information Fragments in Software Repositories.
CoRR, 2021

A 24Gb/s/pin 8Gb GDDR6 with a Half-Rate Daisy-Chain-Based Clocking Architecture and IO Circuitry for Low-Noise Operation.
Proceedings of the IEEE International Solid-State Circuits Conference, 2021

Visualization Support for Multi-criteria Decision Making in Software Issue Propagation.
Proceedings of the 14th IEEE Pacific Visualization Symposium, 2021

Mixed-Initiative Approach to Extract Data from Pictures of Medical Invoice.
Proceedings of the 14th IEEE Pacific Visualization Symposium, 2021

2013
Automating Stressmark Generation for Testing Processor Voltage Fluctuations.
IEEE Micro, 2013

Performance boosting under reliability and power constraints.
Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2013

2012
AUDIT: Stress Testing the Automatic Way.
Proceedings of the 45th Annual IEEE/ACM International Symposium on Microarchitecture, 2012

2011
Automated di/dt stressmark generation for microprocessor power delivery networks.
Proceedings of the 2011 International Symposium on Low Power Electronics and Design, 2011


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