Young-Sik Ghim

Orcid: 0000-0002-4052-4939

According to our database1, Young-Sik Ghim authored at least 2 papers between 2022 and 2024.

Collaborative distances:
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Bibliography

2024
DYnet++: A Deep Learning Based Single-Shot Phase-Measuring Deflectometry for the 3-D Measurement of Complex Free-Form Surfaces.
IEEE Trans. Ind. Electron., February, 2024

2022
Single-shot deep learning deflectometry training data using deformable mirror.
Dataset, December, 2022


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