Young-Sik Ghim
Orcid: 0000-0002-4052-4939
According to our database1,
Young-Sik Ghim
authored at least 2 papers
between 2022 and 2024.
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Bibliography
2024
DYnet++: A Deep Learning Based Single-Shot Phase-Measuring Deflectometry for the 3-D Measurement of Complex Free-Form Surfaces.
IEEE Trans. Ind. Electron., February, 2024
2022
Dataset, December, 2022