Young Pil Kim
According to our database1,
Young Pil Kim
authored at least 2 papers
between 2001 and 2003.
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Bibliography
2003
Electrical analysis of DRAM cell transistors for the root-cause addressing of the tRDL time-delay failure.
Microelectron. Reliab., 2003
2001
Analysis of retention tail distribution induced by scaled shallow trench isolation for high densityDRAMs.
Microelectron. Reliab., 2001