Young-Mok Bae

Orcid: 0000-0002-0033-6642

According to our database1, Young-Mok Bae authored at least 5 papers between 2021 and 2024.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Links

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Bibliography

2024
Development of a spatial dimension-based taxonomy for classifying the defect patterns in a wafer bin map.
Adv. Eng. Informatics, 2024

2023
Development of taxonomy for classifying defect patterns on wafer bin map using Bin2Vec and clustering methods.
Comput. Ind., November, 2023

Detecting abnormal behavior of automatic test equipment using autoencoder with event log data.
Comput. Ind. Eng., September, 2023

2022
Approach to derive golden paths based on machine sequence patterns in multistage manufacturing process.
J. Intell. Manuf., 2022

2021
An oversampling method for wafer map defect pattern classification considering small and imbalanced data.
Comput. Ind. Eng., 2021


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