Young-Kwan Park

According to our database¹, Young-Kwan Park authored at least 6 papers between 2000 and 2008.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of five.

Timeline

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PhD thesis

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Bibliography

2008

The Statistical Failure Analysis for the Design of Robust SRAM in Nano-Scale Era.

[BibT_eX]

[DOI]

Proceedings of the 9th International Symposium on Quality of Electronic Design (ISQED 2008), 2008

2006

Sensing Margin Analysis of MLC Flash Memories Using a Novel Unified Statistical Model.

[BibT_eX]

[DOI]

Proceedings of the 7th International Symposium on Quality of Electronic Design (ISQED 2006), 2006

2003

Investigation of the capacitance deviation due to metal-fills and the effective interconnect geometry modeling.

[BibT_eX]

[DOI]

Proceedings of the 4th International Symposium on Quality of Electronic Design (ISQED 2003), 2003

2002

Characterizing the Current Degradation of Abnormally Structured MOS Transistors Using a 3D Poisson Solver.

[BibT_eX]

[DOI]

Proceedings of the 3rd International Symposium on Quality of Electronic Design, 2002

2001

Performance Improvement for High Speed Devices Using E-tests and the SPICE Model.

[BibT_eX]

[DOI]

Proceedings of the 2nd International Symposium on Quality of Electronic Design (ISQED 2001), 2001

2000

Three Dimensional Analysis of Thermal Degradation Effects in FDSOI MOSFET's.

[BibT_eX]

[DOI]

Proceedings of the 1st International Symposium on Quality of Electronic Design (ISQED 2000), 2000

Young-Kwan Park

Timeline

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Links

On csauthors.net:

Bibliography

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