Young-Chan Oh
According to our database1,
Young-Chan Oh
authored at least 3 papers
between 2021 and 2024.
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Bibliography
2024
Development of a spatial dimension-based taxonomy for classifying the defect patterns in a wafer bin map.
Adv. Eng. Informatics, 2024
2023
Development of taxonomy for classifying defect patterns on wafer bin map using Bin2Vec and clustering methods.
Comput. Ind., November, 2023
2021
An oversampling method for wafer map defect pattern classification considering small and imbalanced data.
Comput. Ind. Eng., 2021