Yoshiyuki Kawashima
According to our database1,
Yoshiyuki Kawashima
authored at least 3 papers
between 2013 and 2015.
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Bibliography
2015
Investigation of the data retention mechanism and modeling for the high reliability embedded split-gate MONOS flash memory.
Proceedings of the IEEE International Reliability Physics Symposium, 2015
2014
40-nm Embedded Split-Gate MONOS (SG-MONOS) Flash Macros for Automotive With 160-MHz Random Access for Code and Endurance Over 10 M Cycles for Data at the Junction Temperature of 170°C.
IEEE J. Solid State Circuits, 2014
2013
40nm embedded SG-MONOS flash macros for automotive with 160MHz random access for code and endurance over 10M cycles for data.
Proceedings of the 2013 IEEE International Solid-State Circuits Conference, 2013