Yoshino K. Fukai
According to our database1,
Yoshino K. Fukai
authored at least 5 papers
between 2002 and 2012.
Collaborative distances:
Collaborative distances:
Timeline
2002
2004
2006
2008
2010
2012
0
1
2
1
1
1
1
1
Legend:
Book In proceedings Article PhD thesis Dataset OtherLinks
On csauthors.net:
Bibliography
2012
Performance of InP/InGaAs HBTs with a Thin Highly <i>N</i>-Type Doped Layer in the Emitter-Base Heterojunction Vicinity.
IEICE Trans. Electron., 2012
2009
Emitter-metal-related degradation in InP-based HBTs operating at high current density and its suppression by refractory metal.
Microelectron. Reliab., 2009
2008
IEICE Trans. Electron., 2008
2006
Improved stability in wide-recess InP HEMTs by means of a fully passivated two-step-recess gate.
IEICE Electron. Express, 2006
2002
Bias-stress-induced increase in parasitic resistance of InP-based InAlAs/InGaAs HEMTs.
Microelectron. Reliab., 2002