Yoshinao Harada

According to our database, Yoshinao Harada authored at least 2 papers in 2001.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2001

Effects of the sputtering deposition process of metal gate electrode on the gate dielectric characteristics.

Takayuki Yamada, Masaru Moriwaki, Yoshinao Harada, Shinji Fujii, Koji Eriguchi

Microelectron. Reliab., 2001

Effects of base layer thickness on reliability of CVD Si₃N₄ stack gate dielectrics.

Koji Eriguchi, Yoshinao Harada, Masaaki Niwa

Microelectron. Reliab., 2001