Yoshiki Tsujihashi
According to our database1,
Yoshiki Tsujihashi
authored at least 7 papers
between 1991 and 2019.
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Bibliography
2019
A Cost Effective Test Screening Circuit for embedded SRAM with Resume Standby on 110-nm SoC/MCU.
Proceedings of the IEEE Asian Solid-State Circuits Conference, 2019
2015
A cost effective test screening method on 40-nm 4-Mb embedded SRAM for low-power MCU.
Proceedings of the IEEE Asian Solid-State Circuits Conference, 2015
2014
Proceedings of the Fifteenth International Symposium on Quality Electronic Design, 2014
40 nm Dual-port and two-port SRAMs for automotive MCU applications under the wide temperature range of -40 to 170°C with test screening against write disturb issues.
Proceedings of the IEEE Asian Solid-State Circuits Conference, 2014
1998
Proceedings of the 1998 International Symposium on Low Power Electronics and Design, 1998
1994
IEEE J. Solid State Circuits, January, 1994
1991
IEEE J. Solid State Circuits, March, 1991