Yoshiki Tsujihashi

According to our database, Yoshiki Tsujihashi authored at least 6 papers between 1994 and 2019.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2019

A Cost Effective Test Screening Circuit for embedded SRAM with Resume Standby on 110-nm SoC/MCU.

Yoshisato Yokoyama, Kenji Goto, Tomohiro Miura, Yukari Ouchi, Daisuke Nakamura, Jiro Ishikawa, Shunya Nagata, Yoshiki Tsujihashi, Yuichiro Ishii

Proceedings of the IEEE Asian Solid-State Circuits Conference, 2019

2015

A cost effective test screening method on 40-nm 4-Mb embedded SRAM for low-power MCU.

Yoshisato Yokoyama, Yuichiro Ishii, Toshihiro Inada, Koji Tanaka, Miki Tanaka, Yoshiki Tsujihashi, Koji Nii

Proceedings of the IEEE Asian Solid-State Circuits Conference, 2015

2014

40nm Ultra-low leakage SRAM at 170 deg.C operation for embedded flash MCU.

Yoshisato Yokoyama, Yuichiro Ishii, Hidemitsu Kojima, Atsushi Miyanishi, Yoshiki Tsujihashi, Shinobu Asayama, Kazutoshi Shiba, Koji Tanaka, Tatsuya Fukuda, Koji Nii, Kazumasa Yanagisawa

Proceedings of the Fifteenth International Symposium on Quality Electronic Design, 2014

40 nm Dual-port and two-port SRAMs for automotive MCU applications under the wide temperature range of -40 to 170°C with test screening against write disturb issues.

Yoshisato Yokoyama, Yuichiro Ishii, Koji Tanaka, Tatsuya Fukuda, Yoshiki Tsujihashi, Atsushi Miyanishi, Shinobu Asayama, Keiichi Maekawa, Kazutoshi Shiba, Koji Nii

Proceedings of the IEEE Asian Solid-State Circuits Conference, 2014

1998

A low power SRAM using auto-backgate-controlled MT-CMOS.

Koji Nii, Hiroshi Makino, Yoshiki Tsujihashi, Chikayoshi Morishima, Yasushi Hayakawa, Hiroyuki Nunogami, Takahiko Arakawa, Hisanori Hamano

Proceedings of the 1998 International Symposium on Low Power Electronics and Design, 1998

1994

A high-density data-path generator with stretchable cells.

Yoshiki Tsujihashi, Hisashi Matsumoto, Hidekatsu Nishimaki, Atsushi Miyanishi, Hiroomi Nakao, Osamu Kitada, Shuhei Iwade, Shinpei Kayano, Masayoshi Sakao

IEEE J. Solid State Circuits, January, 1994