Yoshikazu Nagamura
Orcid: 0000-0002-9364-9997
According to our database1,
Yoshikazu Nagamura
authored at least 2 papers
between 2021 and 2023.
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Bibliography
2023
Toward Improvement and Evaluation of Reconstruction Capability of CapsNet-Based Wafer Map Defect Pattern Classifier.
Proceedings of the IEEE International Test Conference in Asia, 2023
2021
Proceedings of the 30th IEEE Asian Test Symposium, 2021