Yoshikazu Morooka

According to our database, Yoshikazu Morooka authored at least 8 papers between 1985 and 2009.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2009

A Continuous-Adaptive DDRx Interface with Flexible Round-Trip-Time and Full Self Loop-Backed AC Test.

Masaru Haraguchi, Tokuya Osawa, Akira Yamazaki, Chikayoshi Morishima, Toshinori Morihara, Yoshikazu Morooka, Yoshihiro Okuno, Kazutami Arimoto

IEICE Trans. Electron., 2009

2007

A Continuous-Adaptive DDR2 Interface with Flexible Round-Trip-Time and Full Self Loop-Backed AC Test.

Masaru Haraguchi, Tokuya Osawa, Akira Yamazaki, Chikayoshi Morishima, Toshinori Morihara, Yoshikazu Morooka, Yoshihiro Okuno, Kazutami Arimoto

Proceedings of the 2007 IEEE International Solid-State Circuits Conference, 2007

1999

Source-synchronization and timing vernier techniques for 1.2-GB/s SLDRAM interface.

Yasunobu Nakase, Yoshikazu Morooka, David J. Perlman, Daniel J. Kolor, Jae-Myoung Choi, Hyun J. Shin, Tsutomu Yoshimura, Naoya Watanabe, Yoshio Matsuda, Masaki Kumanoya, Michihiro Yamada

IEEE J. Solid State Circuits, 1999

1996

A low power and high speed data transfer scheme with asynchronous compressed pulse width modulation for AS-Memory.

Tadaaki Yamauchi, Yoshikazu Morooka, Hideyuki Ozaki

IEEE J. Solid State Circuits, 1996

1994

An efficient back-bias generator with hybrid pumping circuit for 1.5-V DRAMs.

Yasuhiko Tsukikawa, Takeshi Kajimoto, Yasuhiko Okasaka, Yoshikazu Morooka, Kiyohiro Furutani, Hiroshi Miyamoto, Hideyuki Ozaki

IEEE J. Solid State Circuits, April, 1994

An adjustable output driver with a self-recovering Vpp generator for a 4M⨉16 DRAM.

Kiyohiro Furutani, Hiroshi Miyamoto, Yoshikazu Morooka, M. Suwa, Hideyuki Ozaki

IEEE J. Solid State Circuits, March, 1994

1991

An Address Maskable Parallel Testing for Ultra High Density DRAMs.

Yoshikazu Morooka, Shigeru Mori, Hiroshi Miyamoto, Michihiro Yamada

Proceedings of the Proceedings IEEE International Test Conference 1991, 1991

1985

Test Pattern Considerations for Fault Tolerant High Density DRAM.

Hiroshi Miyamoto, Koichiro Mashiko, Yoshikazu Morooka, Kazutami Arimoto, Michihiro Yamada, Takao Nakano

Proceedings of the Proceedings International Test Conference 1985, 1985