Yoshiiku Hanai

According to our database, Yoshiiku Hanai authored at least 7 papers between 2013 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2018

Metrics Visualization Techniques Based on Historical Origins and Functional Layers for Developments by Multiple Organizations.

Ryosuke Ishizue, Hironori Washizaki, Yoshiaki Fukazawa, Sakae Inoue, Yoshiiku Hanai, Masanobu Kanazawa, Katsushi Namba

Int. J. Softw. Eng. Knowl. Eng., 2018

Developer Experience Considering Work Difficulty in Software Development.

Taketo Tsunoda, Hironori Washizaki, Yoshiaki Fukazawa, Sakae Inoue, Yoshiiku Hanai, Masanobu Kanazawa

Int. J. Networked Distributed Comput., 2018

Empirical Study on Specification Metrics to Predict Volatility and Software Defects.

Taketo Tsunoda, Hironori Washizaki, Yoshiaki Fukazawa, Sakae Inoue, Yoshiiku Hanai, Masanobu Kanazawa

Proceedings of the TENCON 2018, 2018

2017

Evaluating the work of experienced and inexperienced developers considering work difficulty in sotware development.

Taketo Tsunoda, Hironori Washizaki, Yoshiaki Fukazawa, Sakae Inoue, Yoshiiku Hanai, Masanobu Kanazawa

Proceedings of the 18th IEEE/ACIS International Conference on Software Engineering, 2017

2016

Metrics Visualization Technique Based on the Origins and Function Layers for OSS-Based Development.

Ryosuke Ishizue, Hironori Washizaki, Yoshiaki Fukazawa, Sakae Inoue, Yoshiiku Hanai, Masanobu Kanazawa, Katsushi Namba

Proceedings of the 2016 IEEE Working Conference on Software Visualization, 2016

2015

How Does Defect Removal Activity of Developer Vary with Development Experience?

Reou Ando, Seiji Sato, Chihiro Uchida, Hironori Washizaki, Yoshiaki Fukazawa, Sakae Inoue, Hiroyuki Ono, Yoshiiku Hanai, Masanobu Kanazawa, Kazutaka Sone, Katsushi Namba, Mikihiko Yamamoto

Proceedings of the 27th International Conference on Software Engineering and Knowledge Engineering, 2015

2013

Effects of Organizational Changes on Product Metrics and Defects.

Seiji Sato, Hironori Washizaki, Yoshiaki Fukazawa, Sakae Inoue, Hiroyuki Ono, Yoshiiku Hanai, Mikihiko Yamamoto

Proceedings of the 20th Asia-Pacific Software Engineering Conference, 2013