Yoshiho Maeda

According to our database, Yoshiho Maeda authored at least 7 papers between 2019 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Process-tolerant III-V/Si Membrane Distributed Reflector Lasers and 50-Gb/s Direct Modulation at 80°C.

Koji Takeda, Takuro Fujii, Yoshiho Maeda, Toru Segawa, Shinji Matsuo

Proceedings of the Optical Fiber Communications Conference and Exhibition, 2024

Uncooled Operation of Directly Modulated Membrane Laser with Buried Sapphire Layer on Si Substrate.

Tatsurou Hiraki, Yoshiho Maeda, Takuro Fujii, Koji Takeda, Takuma Aihara, Toru Segawa, Yasutomo Ota, Satoshi Iwamoto, Yasuhiko Arakawa, Shinji Matsuo

Proceedings of the Optical Fiber Communications Conference and Exhibition, 2024

2022

Over-67-GHz-bandwidth Membrane InGaAlAs EADFB Laser on Si Platform.

Tatsurou Hiraki, Takuma Aihara, Yoshiho Maeda, Takuro Fujii, Tomonari Sato, Tai Tsuchizawa, Shinji Matsuo, Kiyoto Takahata, Takaaki Kakitsuka

Proceedings of the Optical Fiber Communications Conference and Exhibition, 2022

2020

Si-waveguide-coupled Membrane InGaAsP-multiple-quantum-well Photodetector with Large Bandwidth at High Optical Input Power.

Yoshiho Maeda, Tatsurou Hiraki, Takuma Aihara, Takuro Fujii, Koji Takeda, Tai Tsuchizawa, Shinji Matsuo

Proceedings of the Optical Fiber Communications Conference and Exhibition, 2020

50-GHz-bandwidth Electro-absorption Modulator with Membrane InGaAsP Lateral p-i-n Diode on Si Platform.

Tatsurou Hiraki, Takuma Aihara, Yoshiho Maeda, Takuro Fujii, Tai Tsuchizawa, Kiyoto Takahata, Takaaki Kakitsuka, Shinji Matsuo

Proceedings of the European Conference on Optical Communications, 2020

2019

Accurate Fiber Alignment using Silicon Photodiode on Grating Coupler for Wafer-Level Testing.

Yoshiho Maeda, Toru Miura, Shinji Matsuo, Hiroshi Fukuda

Proceedings of the 2019 24th OptoElectronics and Communications Conference (OECC) and 2019 International Conference on Photonics in Switching and Computing (PSC), 2019

All-Optical Performance Characterization of Silicon Mach-Zehnder Modulator for Wafer-Level Test.

Hiroshi Fukuda, Yoshiho Maeda, Toru Miura, Shinji Matsuo

Proceedings of the 2019 24th OptoElectronics and Communications Conference (OECC) and 2019 International Conference on Photonics in Switching and Computing (PSC), 2019