Yoshihito Nishizaki
According to our database1,
Yoshihito Nishizaki
authored at least 3 papers
between 1990 and 2005.
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Bibliography
2005
Low Cost Delay Testing of Nanometer SoCs Using On-Chip Clocking and Test Compression.
Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005
2003
Testing DSM ASIC With Static, \DeltaIDDQ, And Dynamic Test Suite: Implementation And Results.
Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003
1990
Proceedings of the 27th ACM/IEEE Design Automation Conference. Orlando, 1990