Yoshiaki Fukui
According to our database1,
Yoshiaki Fukui
authored at least 4 papers
between 2008 and 2012.
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Bibliography
2012
A Yield and Reliability Improvement Methodology Based on Logic Redundant Repair with a Repairable Scan Flip-Flop Designed by Push Rule.
ACM Trans. Design Autom. Electr. Syst., 2012
2011
Proceedings of the 20th IEEE Asian Test Symposium, 2011
2010
A yield improvement methodology based on logic redundant repair with a repairable scan flip-flop designed by push rule.
Proceedings of the 11th International Symposium on Quality of Electronic Design (ISQED 2010), 2010
2008
Proceedings of the 17th IEEE Asian Test Symposium, 2008