Yoonjong Huh
According to our database1,
Yoonjong Huh
authored at least 7 papers
between 1998 and 2004.
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Bibliography
2004
IEEE J. Solid State Circuits, 2004
2003
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2003
2001
Proceedings of the 2001 International Symposium on Circuits and Systems, 2001
Proceedings of the 2001 International Symposium on Circuits and Systems, 2001
Design-for-ESD-reliability for high-frequency I/O interface circuits in deep-submicron CMOS technology.
Proceedings of the 2001 International Symposium on Circuits and Systems, 2001
Understanding and Addressing the Noise Induced By Electrostatic Discharge in Multiple Power Supply Systems.
Proceedings of the 19th International Conference on Computer Design (ICCD 2001), 2001
1998
A study of hot-carrier-induced mismatch drift: a reliability issue for VLSI circuits.
IEEE J. Solid State Circuits, 1998