Yoni Xiong

According to our database1, Yoni Xiong authored at least 9 papers between 2021 and 2024.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Links

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Bibliography

2024
Multiple Bit Upsets in Register Circuits at the 5-nm Bulk FinFET Node.
Proceedings of the IEEE International Reliability Physics Symposium, 2024

Total-Ionizing Dose Damage from X-Ray PCB Inspection Systems.
Proceedings of the IEEE International Reliability Physics Symposium, 2024

Single-Event Performance of Flip Flop Designs at the 5-nm Bulk FinFET Node at Near-Threshold Supply Voltages.
Proceedings of the IEEE International Reliability Physics Symposium, 2024

2023
Soft Error Rate Predictions for Terrestrial Neutrons at the 3-nm Bulk FinFET Technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

Effects of Collected Charge and Drain Area on SE Response of SRAMs at the 5-nm FinFET Node.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022
Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

Single-Event Latchup Vulnerability at the 7-nm FinFET Node.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021
Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors at the 7-nm Node.
Proceedings of the IEEE International Reliability Physics Symposium, 2021

Effects of Temperature and Supply Voltage on Soft Errors for 7-nm Bulk FinFET Technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2021


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