Yoni Xiong

According to our database, Yoni Xiong authored at least 9 papers between 2021 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2024

Multiple Bit Upsets in Register Circuits at the 5-nm Bulk FinFET Node.

Yoni Xiong, Nicholas J. Pieper, Jenna B. Kronenberg, Dennis R. Ball, Megan Casey, Bharat L. Bhuva

Proceedings of the IEEE International Reliability Physics Symposium, 2024

Total-Ionizing Dose Damage from X-Ray PCB Inspection Systems.

Nicholas J. Pieper, M. Chun, Yoni Xiong, H. M. Dattilo, Jenna B. Kronenberg, Sanghyeon Baeg, Shi-Jie Wen, Rita Fung, D. Chan, C. Escobar, Bharat L. Bhuva

Proceedings of the IEEE International Reliability Physics Symposium, 2024

Single-Event Performance of Flip Flop Designs at the 5-nm Bulk FinFET Node at Near-Threshold Supply Voltages.

Jenna B. Kronenberg, Yoni Xiong, Nicholas J. Pieper, Dennis R. Ball, Bharat L. Bhuva

Proceedings of the IEEE International Reliability Physics Symposium, 2024

2023

Soft Error Rate Predictions for Terrestrial Neutrons at the 3-nm Bulk FinFET Technology.

Yoni Xiong, Yueh Chiang, Nicholas J. Pieper, Dennis R. Ball, Bharat L. Bhuva

Proceedings of the IEEE International Reliability Physics Symposium, 2023

Effects of Collected Charge and Drain Area on SE Response of SRAMs at the 5-nm FinFET Node.

Nicholas J. Pieper, Yoni Xiong, Dennis R. Ball, J. Pasternak, Bharat L. Bhuva

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022

Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment.

Yoni Xiong, Alexandra Feeley, Nicholas J. Pieper, Dennis R. Ball, Balaji Narasimham, John Brockman, N. A. Dodds, S. A. Wender, Shi-Jie Wen, Rita Fung, Bharat L. Bhuva

Proceedings of the IEEE International Reliability Physics Symposium, 2022

Single-Event Latchup Vulnerability at the 7-nm FinFET Node.

Nicholas J. Pieper, Yoni Xiong, Alexandra Feeley, Dennis R. Ball, Bharat L. Bhuva

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021

Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors at the 7-nm Node.

Yoni Xiong, Alexandra Feeley, Lloyd W. Massengill, Bharat L. Bhuva, Shi-Jie Wen, Rita Fung

Proceedings of the IEEE International Reliability Physics Symposium, 2021

Effects of Temperature and Supply Voltage on Soft Errors for 7-nm Bulk FinFET Technology.

Alexandra Feeley, Yoni Xiong, Bharat L. Bhuva, Balaji Narasimham, Shi-Ji Wen, Rita Fung

Proceedings of the IEEE International Reliability Physics Symposium, 2021