Yongkang Xue

According to our database, Yongkang Xue authored at least 11 papers between 2016 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

Fast Aging-Aware Timing Analysis Framework With Temporal-Spatial Graph Neural Network.

Jinfeng Ye, Pengpeng Ren, Yongkang Xue, Hui Fang, Zhigang Ji

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., June, 2024

A strong physical unclonable function with machine learning immunity for Internet of Things application.

Pengpeng Ren, Yongkang Xue, Linglin Jing, Lining Zhang, Runsheng Wang, Zhigang Ji

Sci. China Inf. Sci., 2024

Investigation of Positive Bias Temperature Instability in advanced FinFET nodes.

Yongkang Xue, Miaojia Yuan, Yu Li, Da Wang, Maokun Wu, Pengpeng Ren, Lining Zhang, Runsheng Wang, Zhigang Ji, Ru Huang

Proceedings of the IEEE International Reliability Physics Symposium, 2024

A New Method of Automatic Extraction of RTN and OMI-Friendly Implementation.

Yu Xiao, Chenyang Zhang, Da Wang, Yongkang Xue, Pengpeng Ren, Zhigang Ji

Proceedings of the IEEE International Reliability Physics Symposium, 2024

Convolution-Based Vth Shift Prediction and the New 9T2C Pixel Circuit in LTPS TFT AMOLED.

Shiyu Xia, Longda Zhou, Kewei Wang, Xiaobin Fan, Yongkang Xue, Qi Shan, Hannian Wang, Pengpeng Ren, Zhigang Ji, Ru Huang

Proceedings of the IEEE International Reliability Physics Symposium, 2024

Sub-20-nm DRAM Technology under Negative Bias Temperature Instability (NBTI): from Characterization to Physical Origin Identification.

Da Wang, Yongkang Xue, Yong Liu, Pengpeng Ren, Zixuan Sun, Zirui Wang, Yueyang Liu, Zhijun Cheng, Haiyang Yang, Xiangli Liu, Blacksmith Wu, Kanyu Cao, Runsheng Wang, Zhigang Ji, Ru Huang

Proceedings of the IEEE International Reliability Physics Symposium, 2024

Investigation of Interplays between Body Biasing and Hot Carrier Degradation (HCD) in Advanced NMOS FinFETs.

Zixuan Sun, Yongkang Xue, Haoran Lu, Pengpeng Ren, Zirui Wang, Zhigang Ji, Runsheng Wang, Ru Huang

Proceedings of the IEEE International Reliability Physics Symposium, 2024

2023

Catching the Missing EM Consequence in Soft Breakdown Reliability in Advanced FinFETs: Impacts of Self-heating, On-State TDDB, and Layout Dependence.

Zuoyuan Dong, Zixuan Sun, Xin Yang, Xiaomei Li, Yongkang Xue, Chen Luo, Puyang Cai, Zirui Wang, Shuying Wang, Yewei Zhang, Chaolun Wang, Pengpeng Ren, Zhigang Ji, Xing Wu, Runsheng Wang, Ru Huang

Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023

Investigation of Hot Carrier Enhanced Body Bias Effect in Advanced FinFET Technology.

Zixuan Sun, Haoran Lu, Yongkang Xue, Wenpu Luo, Zirui Wang, Jiayang Zhang, Zhigang Ji, Runsheng Wang, Ru Huang

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022

Mapping South America's Drylands through Remote Sensing - A Review of the Methodological Trends and Current Challenges.

Khalil Ali Ganem, Yongkang Xue, Ariane de Almeida Rodrigues, Washington Franca-Rocha, Marceli Terra de Oliveira, Nathália S. Carvalho, Efrain Yury Turpo Cayo, Marcos Reis Rosa, Andeise Cerqueira Dutra, Yosio Edemir Shimabukuro

Remote. Sens., 2022

2016

Vegetation Responses to Climate Variability in the Northern Arid to Sub-Humid Zones of Sub-Saharan Africa.

Khaldoun Rishmawi, Stephen D. Prince, Yongkang Xue

Remote. Sens., 2016