Yong Hyeon Yi
Orcid: 0000-0001-6834-000X
According to our database1,
Yong Hyeon Yi
authored at least 4 papers
between 2022 and 2024.
Collaborative distances:
Collaborative distances:
Timeline
2022
2023
2024
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Bibliography
2024
Electromigration Test Chip Experiments from Realistic Power Grid Structures: Failure Trend Comparison and Statistical Analysis.
Proceedings of the IEEE International Reliability Physics Symposium, 2024
2023
Electromigration Assessment in Power Grids with Account of Redundancy and Non-Uniform Temperature Distribution.
Proceedings of the 2023 International Symposium on Physical Design, 2023
Studying the Impact of Temperature Gradient on Electromigration Lifetime Using a Power Grid Test Structure with On-Chip Heaters.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
2022
Experimental Validation of a Novel Methodology for Electromigration Assessment in On-Chip Power Grids.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022