Yong Chang Kim

According to our database, Yong Chang Kim authored at least 7 papers between 1998 and 2005.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2005

Combinational automatic test pattern generation for acyclic sequential circuits.

Yong Chang Kim, Vishwani D. Agrawal, Kewal K. Saluja

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2005

2003

Exclusive Test and its Applications to Fault Diagnosis.

Vishwani D. Agrawal, Dong Hyun Baik, Yong Chang Kim, Kewal K. Saluja

Proceedings of the 16th International Conference on VLSI Design (VLSI Design 2003), 2003

2002

Multiple Faults: Modeling, Simulation and Test.

Yong Chang Kim, Vishwani D. Agrawal, Kewal K. Saluja

Proceedings of the 7th Asia and South Pacific Design Automation Conference (ASP-DAC 2002), 2002

2001

Combinational Test Generation for Acyclic SequentialCircuits using a Balanced ATPG Model.

Yong Chang Kim, Kewal K. Saluja, Vishwani D. Agrawal

Proceedings of the 14th International Conference on VLSI Design (VLSI Design 2001), 2001

Combinational test generation for various classes of acyclic sequential circuits.

Yong Chang Kim, Vishwani D. Agrawal, Kewal K. Saluja

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

1999

A Correlation Matrix Method of Clock Partitioning for Sequential Circuit Testability.

Yong Chang Kim, Kewal K. Saluja, Vishwani D. Agrawal

Proceedings of the 9th Great Lakes Symposium on VLSI (GLS-VLSI '99), 1999

1998

Sequential test generators: past, present and future.

Yong Chang Kim, Kewal K. Saluja

Integr., 1998