Yon Shin Teo

Orcid: 0009-0006-5081-6712

According to our database1, Yon Shin Teo authored at least 9 papers between 2017 and 2024.

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Bibliography

2024
Is AI testing beneficial for the manufacturer and social welfare? Optimal test strategy of a smart product.
Expert Syst. Appl., 2024

A Parallel and Distributed Quantum SAT Solver Based on Entanglement and Teleportation.
Proceedings of the Tools and Algorithms for the Construction and Analysis of Systems, 2024

LLMs for Relational Reasoning: How Far are We?
LLM4CODE@ICSE, 2024

Improving Neural Logic Machines via Failure Reflection.
Proceedings of the Forty-first International Conference on Machine Learning, 2024

2023
A Parallel and Distributed Quantum SAT Solver Based on Entanglement and Quantum Teleportation.
CoRR, 2023

An Automatic Test Plan Generation Approach for Automotive Software Testing.
Proceedings of the New Trends in Intelligent Software Methodologies, Tools and Techniques, 2023

2022
A Holistic Automated Software Structure Exploration Framework for Testing.
Proceedings of the New Trends in Intelligent Software Methodologies, Tools and Techniques, 2022

2021
Automatic HMI Structure Exploration Via Curiosity-Based Reinforcement Learning.
Proceedings of the 36th IEEE/ACM International Conference on Automated Software Engineering, 2021

2017
Towards a deep learning powered query engine for urban planning.
Proceedings of the 2017 International Conference on Asian Language Processing, 2017


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