Yoji Bando

According to our database, Yoji Bando authored at least 9 papers between 2009 and 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2015

A 4.2 mW 50 MS/s 13 bit CMOS SAR ADC With SNR and SFDR Enhancement Techniques.

Takuji Miki, Takashi Morie, Kazuo Matsukawa, Yoji Bando, Takeshi Okumoto, Koji Obata, Shiro Sakiyama, Shiro Dosho

IEEE J. Solid State Circuits, 2015

2013

Measurements and Simulation of Sensitivity of Differential-Pair Transistors against Substrate Voltage Variation.

Satoshi Takaya, Yoji Bando, Toru Ohkawa, Toshiharu Takaramoto, Toshio Yamada, Masaaki Souda, Shigetaka Kumashiro, Tohru Mogami, Makoto Nagata

IEICE Trans. Electron., 2013

A 71dB-SNDR 50MS/s 4.2mW CMOS SAR ADC by SNR enhancement techniques utilizing noise.

Takashi Morie, Takuji Miki, Kazuo Matsukawa, Yoji Bando, Takeshi Okumoto, Koji Obata, Shiro Sakiyama, Shiro Dosho

Proceedings of the 2013 IEEE International Solid-State Circuits Conference, 2013

2012

On-Chip In-Place Measurements of V_th and Signal/Substrate Response of Differential Pair Transistors.

Yoji Bando, Satoshi Takaya, Toru Ohkawa, Toshiharu Takaramoto, Toshio Yamada, Masaaki Souda, Shigetaka Kumashiro, Tohru Mogami, Makoto Nagata

IEICE Trans. Electron., 2012

2011

On-Chip Single Tone Pseudo-Noise Generator for Analog IP Noise Tolerance Measurement.

Masaaki Souda, Yoji Bando, Satoshi Takaya, Toru Ohkawa, Toshiharu Takaramoto, Toshio Yamada, Shigetaka Kumashiro, Tohru Mogami, Makoto Nagata

IEICE Trans. Electron., 2011

A Continuous-Time Waveform Monitoring Technique for On-Chip Power Noise Measurements in VLSI Circuits.

Yoji Bando, Satoshi Takaya, Toru Ohkawa, Toshiharu Takaramoto, Toshio Yamada, Masaaki Souda, Shigetaka Kumashiro, Tohru Mogami, Makoto Nagata

IEICE Trans. Electron., 2011

Microprocessor power noise measurements with different levels of resource occupancy.

Yoji Bando, Makoto Nagata

IEICE Electron. Express, 2011

Accurate analysis of substrate sensitivity of active transistors in an analog circuit.

Satoshi Takaya, Yoji Bando, Toru Ohkawa, Toshiharu Takaramoto, Toshio Yamada, Masaaki Souda, Shigetaka Kumashiro, Tohru Mogami, Makoto Nagata

Proceedings of the 12th International Symposium on Quality Electronic Design, 2011

2009

A full chip integrated power and substrate noise analysis framework for mixed-signal SoC design.

Daisuke Kosaka, Yoji Bando, Goichi Yokomizo, Kunihiko Tsuboi, Ying Shiun Li, Shen Lin, Makoto Nagata

Proceedings of the IEEE Custom Integrated Circuits Conference, 2009