Yohei Tan

According to our database, Yohei Tan authored at least 6 papers between 2010 and 2011.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2011

Background Self-Calibration Algorithm for Pipelined ADC Using Split ADC Scheme.

Takuya Yagi, Kunihiko Usui, Tatsuji Matsuura, Satoshi Uemori, Satoshi Ito, Yohei Tan, Haruo Kobayashi

IEICE Trans. Electron., 2011

Design for Testability That Reduces Linearity Testing Time of SAR ADCs.

Tomohiko Ogawa, Haruo Kobayashi, Satoshi Uemori, Yohei Tan, Satoshi Ito, Nobukazu Takai, Takahiro J. Yamaguchi, Kiichi Niitsu

IEICE Trans. Electron., 2011

2010

Background calibration algorithm for pipelined ADC with open-loop residue amplifier using split ADC structure.

Takuya Yagi, Kunihiko Usui, Tatsuji Matsuura, Satoshi Uemori, Yohei Tan, Satoshi Ito, Haruo Kobayashi

Proceedings of the IEEE Asia Pacific Conference on Circuits and Systems, 2010

ADC linearity test signal generation algorithm.

Satoshi Uemori, Takahiro J. Yamaguchi, Satoshi Ito, Yohei Tan, Haruo Kobayashi, Nobukazu Takai, Kiichi Niitsu, Nobuyoshi Ishikawa

Proceedings of the IEEE Asia Pacific Conference on Circuits and Systems, 2010

SAR ADC that is configurable to optimize yield.

Tomohiko Ogawa, Haruo Kobayashi, Yohei Tan, Satoshi Ito, Satoshi Uemori, Nobukazu Takai, Kiichi Niitsu, Takahiro J. Yamaguchi, Tatsuji Matsuura, Nobuyoshi Ishikawa

Proceedings of the IEEE Asia Pacific Conference on Circuits and Systems, 2010

Stochastic TDC architecture with self-calibration.

Satoshi Ito, Shigeyuki Nishimura, Haruo Kobayashi, Satoshi Uemori, Yohei Tan, Nobukazu Takai, Takahiro J. Yamaguchi, Kiichi Niitsu

Proceedings of the IEEE Asia Pacific Conference on Circuits and Systems, 2010