Yo-Wei Chen

According to our database, Yo-Wei Chen authored at least 2 papers between 2015 and 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2017

Robust test pattern generation for hold-time faults in nanometer technologies.

Yu-Hao Ho, Yo-Wei Chen, Chih-Ming Chang, Kai-Chieh Yang, James Chien-Mo Li

Proceedings of the 2017 International Symposium on VLSI Design, Automation and Test, 2017

2015

Fault Simulation and Test Pattern Generation for Cross-gate Defects in FinFET Circuits.

Kuan-Ying Chiang, Yu-Hao Ho, Yo-Wei Chen, Cheng-Sheng Pan, James Chien-Mo Li

Proceedings of the 24th IEEE Asian Test Symposium, 2015