Yiwen Shi
Orcid: 0000-0003-4152-1470
According to our database1,
Yiwen Shi
authored at least 23 papers
between 2008 and 2025.
Collaborative distances:
Collaborative distances:
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Bibliography
2025
Comput. Stand. Interfaces, 2025
2024
Two-stage fine-tuning with ChatGPT data augmentation for learning class-imbalanced data.
Neurocomputing, 2024
2023
Leveraging GPT-4 for food effect summarization to enhance product-specific guidance development via iterative prompting.
J. Biomed. Informatics, December, 2023
Briefings Bioinform., July, 2023
Fine-tuning BERT for automatic ADME semantic labeling in FDA drug labeling to enhance product-specific guidance assessment.
J. Biomed. Informatics, February, 2023
Proceedings of the Seventeenth International AAAI Conference on Web and Social Media, 2023
2022
CoRR, 2022
Proceedings of the 16th IEEE International Conference on Semantic Computing, 2022
Proceedings of the Social, Cultural, and Behavioral Modeling, 2022
Proceedings of the Fourth International Workshop on Learning with Imbalanced Domains: Theory and Applications, 2022
Proceedings of the Computational Data and Social Networks - 11th International Conference, 2022
2021
Information Extraction From FDA Drug Labeling to Enhance Product-Specific Guidance Assessment Using Natural Language Processing.
Frontiers Res. Metrics Anal., 2021
CoRR, 2021
Proceedings of the Pattern Recognition and Computer Vision - 4th Chinese Conference, 2021
Dual Stream Fusion Network for Multi-spectral High Resolution Remote Sensing Image Segmentation.
Proceedings of the Pattern Recognition and Computer Vision - 4th Chinese Conference, 2021
2013
A Simulated Annealing Inspired Test Optimization Method for Enhanced Detection of Highly Critical Faults and Defects.
J. Electron. Test., 2013
2012
ACM Trans. Design Autom. Electr. Syst., 2012
2011
Proceedings of the 29th IEEE VLSI Test Symposium, 2011
Proceedings of the 2011 IEEE International Test Conference, 2011
Proceedings of the 16th European Test Symposium, 2011
2010
Too many faults, too little time on creating test sets for enhanced detection of highly critical faults and defects.
Proceedings of the 28th IEEE VLSI Test Symposium, 2010
2008
Efficient Determination of Fault Criticality for Manufacturing Test Set Optimization.
Proceedings of the 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 2008