Yingqi Ma

According to our database, Yingqi Ma authored at least 5 papers between 2017 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2022

Design of SEL Self-Recovery Hardness for 90nm COTS Devices Using R-C-S Network with DC-DC Converter.

Jindou Xin, Xiang Zhu, Yingqi Ma, Jianwei Han

Proceedings of the IEEE Asia Pacific Conference on Circuit and Systems, 2022

Design of Integrated Circuit Hard Defect Location System Based on Thermal Laser Stimulation.

Wenjian Wu, Yingqi Ma, Minghui Cai

Proceedings of the IEEE Asia Pacific Conference on Circuit and Systems, 2022

2020

Study on the single-event upset sensitivity of 65-nm CMOS sequential logic circuit.

Sai Li, Jianwei Han, Rui Chen, Shipeng Shangguan, Yingqi Ma, Xuan Wang

IEICE Electron. Express, 2020

Research on the influences of well structure on dose rate effects in 65nm CMOS circuit.

Qian Chen, Jianwei Han, Yingqi Ma, Sai Li, Jingtian Liu, Yaqing Chi, Bin Liang

IEICE Electron. Express, 2020

2017

Comparison of single-event upset generated by heavy ion and pulsed laser.

Bin Liang, Ruiqiang Song, Jianwei Han, Yaqing Chi, Rui Chen, Chunmei Hu, Jianjun Chen, Yingqi Ma, Shipeng Shangguan

Sci. China Inf. Sci., 2017