Yinghua Min
According to our database1,
Yinghua Min
authored at least 55 papers
between 1982 and 2011.
Collaborative distances:
Collaborative distances:
Awards
IEEE Fellow
IEEE Fellow 1997, "For technical leadership in electronic testing and fault-tolerant computing.".
Timeline
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Bibliography
2011
Selected Transition Time Adjustment for Tolerating Crosstalk Effects on Network-on-Chip Interconnects.
IEEE Trans. Very Large Scale Integr. Syst., 2011
2010
Softw. Test. Verification Reliab., 2010
2009
Proceedings of the 2009 15th IEEE Pacific Rim International Symposium on Dependable Computing, 2009
2008
Proceedings of the 5th IEEE Consumer Communications and Networking Conference, 2008
2007
Proceedings of the Managing Traffic Performance in Converged Networks, 2007
Proceedings of the Global Communications Conference, 2007
Proceedings of the 16th Asian Test Symposium, 2007
2005
IEEE Trans. Reliab., 2005
Proceedings of the 11th IEEE Pacific Rim International Symposium on Dependable Computing (PRDC 2005), 2005
2004
Design & Test Education in Asia.
IEEE Des. Test Comput., 2004
2003
J. Comput. Sci. Technol., 2003
J. Comput. Sci. Technol., 2003
A New Software Testing Approach Based on Domain Analysis of Specifications and Programs.
Proceedings of the 14th International Symposium on Software Reliability Engineering (ISSRE 2003), 2003
Proceedings of the 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China, 2003
Proceedings of the 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China, 2003
2002
The monotonic increasing relationship between average powers of CMOS VLSI circuits with and without delay and its applications.
Sci. China Ser. F Inf. Sci., 2002
Sci. China Ser. F Inf. Sci., 2002
Proceedings of the 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA, 2002
2001
Proceedings of the 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 2001
Proceedings of the 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, 2001
Proceedings of the 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, 2001
2000
Proceedings of the Seventh International Conference on Parallel and Distributed Systems, 2000
Proceedings of the 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, 2000
Proceedings of the 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, 2000
1999
Proceedings of the 1999 Pacific Rim International Symposium on Dependable Computing (PRDC 1999), 1999
1998
On concurrent multiple error diagnosability in linear analog circuits using continuous checksum.
Int. J. Circuit Theory Appl., 1998
Proceedings of the 7th Asian Test Symposium (ATS '98), 2-4 December 1998, Singapore, 1998
Proceedings of the 7th Asian Test Symposium (ATS '98), 2-4 December 1998, Singapore, 1998
1997
Proceedings of the Proceedings IEEE International Test Conference 1997, 1997
Proceedings of the Proceedings 1997 International Conference on Computer Design: VLSI in Computers & Processors, 1997
Proceedings of the 6th Asian Test Symposium (ATS '97), 17-18 November 1997, 1997
Proceedings of the 6th Asian Test Symposium (ATS '97), 17-18 November 1997, 1997
Proceedings of the 6th Asian Test Symposium (ATS '97), 17-18 November 1997, 1997
1996
J. Comput. Sci. Technol., 1996
Hardware reduction in continuous checksum-based analog checkers: Algorithm and its analysis.
J. Electron. Test., 1996
Proceedings of the 9th International Conference on VLSI Design (VLSI Design 1996), 1996
Proceedings of the 5th Asian Test Symposium (ATS '96), 1996
1995
J. Comput. Sci. Technol., 1995
Feasibility and Effectiveness of the Algorithm for Overhead Reduction in Analog Checkers.
Proceedings of the Digest of Papers: FTCS-25, 1995
Proceedings of the 4th Asian Test Symposium (ATS '95), 1995
Proceedings of the 4th Asian Test Symposium (ATS '95), 1995
1994
Proceedings of the Seventh International Conference on VLSI Design, 1994
1993
Proceedings of the 11th IEEE VLSI Test Symposium (VTS'93), 1993
1991
IEEE Trans. Computers, 1991
1988
IEEE Trans. Computers, 1988
1986
Pseudo-Exhaustive Testing Strategy for Large Combinational Circuits.
Comput. Syst. Sci. Eng., 1986
1982
Proceedings of the 19th Design Automation Conference, 1982