Yingfen Wei
Orcid: 0000-0003-2037-4440
According to our database1,
Yingfen Wei
authored at least 3 papers
between 2022 and 2024.
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Bibliography
2024
Comprehensive Analysis of Duty-Cycle Induced Degradations in HfxZr1-xO2-Based Ferroelectric Capacitors: Behavior, Modeling, and Optimization.
Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024
High-efficient and Comprehensive Modeling of MFIM Ferroelectric Tunnel Junctions for Non-volatile/Volatile Applications.
Proceedings of the IEEE International Memory Workshop, 2024
2022
Synaptic behaviour in ferroelectric epitaxial rhombohedral Hf<sub>0.5</sub>Zr<sub>0.5</sub>O<sub>2</sub> thin films.
Neuromorph. Comput. Eng., December, 2022