Yingfen Wei

Orcid: 0000-0003-2037-4440

According to our database1, Yingfen Wei authored at least 3 papers between 2022 and 2024.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2024
Comprehensive Analysis of Duty-Cycle Induced Degradations in HfxZr1-xO2-Based Ferroelectric Capacitors: Behavior, Modeling, and Optimization.
Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024

High-efficient and Comprehensive Modeling of MFIM Ferroelectric Tunnel Junctions for Non-volatile/Volatile Applications.
Proceedings of the IEEE International Memory Workshop, 2024

2022
Synaptic behaviour in ferroelectric epitaxial rhombohedral Hf<sub>0.5</sub>Zr<sub>0.5</sub>O<sub>2</sub> thin films.
Neuromorph. Comput. Eng., December, 2022


  Loading...