Yimen Zhang
Orcid: 0000-0002-4887-735X
According to our database1,
Yimen Zhang
authored at least 21 papers
between 2008 and 2023.
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Bibliography
2023
ATT-TA: A Cooperative Multiagent Deep Reinforcement Learning Approach for TSV Assignment in 3-D ICs.
IEEE Trans. Very Large Scale Integr. Syst., December, 2023
Thermal-Aware Fixed-Outline 3-D IC Floorplanning: An End-to-End Learning-Based Approach.
IEEE Trans. Very Large Scale Integr. Syst., December, 2023
A Novel Thermal-Aware Floorplanning and TSV Assignment With Game Theory for Fixed-Outline 3-D ICs.
IEEE Trans. Very Large Scale Integr. Syst., November, 2023
Microelectron. J., 2023
2022
Microelectron. J., 2022
An augmented small-signal model of InP HBT with its analytical-based parameter extraction technique.
Microelectron. J., 2022
2021
Characteristics of A Novel Quaternary Tunneling Field-Effect Transistor for Low Power Applicaitons.
Proceedings of the 2021 IEEE International Conference on Integrated Circuits, 2021
2020
IEEE Access, 2020
Effects of 5 MeV Proton Irradiation on 1200 V 4H-SiC VDMOSFETs ON-State Characteristics.
IEEE Access, 2020
2019
Proceedings of the 13th IEEE International Conference on ASIC, 2019
2018
Analysis and Design of a Broadband Frequency Divider Using Modified Active Loads in GaAs HBT.
J. Circuits Syst. Comput., 2018
IEICE Electron. Express, 2018
IEICE Electron. Express, 2018
2017
Model of phonon contribution to nonionizing energy loss (NIEL) for InP/InGaAs heterojunction.
Microelectron. Reliab., 2017
Improved analytical model of surface potential with modified boundary conditions for double gate tunnel FETs.
Microelectron. Reliab., 2017
2016
J. Circuits Syst. Comput., 2016
2015
Proceedings of the 2015 IEEE 11th International Conference on ASIC, 2015
2012
The model parameter extraction and simulation for the effects of gamma irradiation on the DC characteristics of InGaP/GaAs single heterojunction bipolar transistors.
Microelectron. Reliab., 2012
2011
Characteristics of the intrinsic defects in unintentionally doped 4H-SiC after thermal annealing.
Microelectron. Reliab., 2011
2008
J. Circuits Syst. Comput., 2008
Sci. China Ser. F Inf. Sci., 2008