Yibo Lei
Orcid: 0000-0001-5955-7848
According to our database1,
Yibo Lei
authored at least 2 papers
between 2010 and 2023.
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Bibliography
2023
Single-event burnout hardening evaluation with current and electric field redistribution of high voltage LDMOS transistors based on TCAD Simulations.
Microelectron. J., February, 2023
2010