Yi-Shing Chang

According to our database, Yi-Shing Chang authored at least 22 papers between 1992 and 2020.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2020

Multidomain Inter/Intrachip Silicon Photonic Networks for Energy-Efficient Rack-Scale Computing Systems.

Peng Yang, Zhehui Wang, Zhifei Wang, Jiang Xu, Yi-Shing Chang, Xuanqi Chen, Rafael K. V. Maeda, Jun Feng

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020

A Cross-Layer Optimization Framework for Integrated Optical Switches in Data Centers.

Zhifei Wang, Peng Yang, Yi-Shing Chang, Jiang Xu, Xuanqi Chen, Zhehui Wang, Jun Feng

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020

CAMON: Low-Cost Silicon Photonic Chiplet for Manycore Processors.

Zhehui Wang, Zhifei Wang, Jiang Xu, Yi-Shing Chang, Jun Feng, Xuanqi Chen, Shixi Chen, Jiaxu Zhang

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020

Modeling and Analysis of Optical Modulators Based on Free-Carrier Plasma Dispersion Effect.

Xuanqi Chen, Zhifei Wang, Yi-Shing Chang, Jiang Xu, Jun Feng, Peng Yang, Zhehui Wang, Luan H. K. Duong

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020

2019

Crosstalk Noise Reduction Through Adaptive Power Control in Inter/Intra-Chip Optical Networks.

Luan H. K. Duong, Peng Yang, Zhifei Wang, Yi-Shing Chang, Jiang Xu, Zhehui Wang, Xuanqi Chen

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2019

2018

A Comprehensive Electro-Optical Model for Silicon Photonic Switches.

Xuanqi Chen, Zhifei Wang, Yi-Shing Chang, Jiang Xu, Peng Yang, Zhehui Wang, Luan H. K. Duong

Proceedings of the 2018 IEEE Computer Society Annual Symposium on VLSI, 2018

2008

A Methodology for Handling Complex Functional Constraints for Large Industrial Designs.

Abhijit Jas, Yi-Shing Chang, Sreejit Chakravarty

J. Electron. Test., 2008

An Industrial Case Study of Sticky Path-Delay Faults.

I-De Huang, Yi-Shing Chang, Sandeep K. Gupta, Sreejit Chakravarty

Proceedings of the 26th IEEE VLSI Test Symposium (VTS 2008), April 27, 2008

On Accelerating Path Delay Fault Simulation of Long Test Sequences.

I-De Huang, Yi-Shing Chang, Suriyaprakash Natarajan, Ramesh Sharma, Sandeep K. Gupta

Proceedings of the 2008 IEEE International Test Conference, 2008

Efficient Selection of Observation Points for Functional Tests.

Jian Kang, Sharad C. Seth, Yi-Shing Chang, Vijay Gangaram

Proceedings of the 9th International Symposium on Quality of Electronic Design (ISQED 2008), 2008

2006

A Study of Implication Based Pseudo Functional Testing.

Manan Syal, Kameshwar Chandrasekar, Vishnu C. Vimjam, Michael S. Hsiao, Yi-Shing Chang, Sreejit Chakravarty

Proceedings of the 2006 IEEE International Test Conference, 2006

An Approach to Minimizing Functional Constraints.

Abhijit Jas, Yi-Shing Chang, Sreejit Chakravarty

Proceedings of the 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 2006

2005

On modeling crosstalk faults.

Sandip Kundu, Sujit T. Zachariah, Yi-Shing Chang, Chandra Tirumurti

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2005

Transition Tests for High Performance Microprocessors.

Yi-Shing Chang, Sreejit Chakravarty, Hiep Hoang, Nick Thorpe, Khen Wee

Proceedings of the 23rd IEEE VLSI Test Symposium (VTS 2005), 2005

Experimental Evaluation of Bridge Patterns for a High Performance Microprocessor.

Sreejit Chakravarty, Yi-Shing Chang, Hiep Hoang, Sridhar Jayaraman, Silvio Picano, Cheryl Prunty, Eric W. Savage, Rehan Sheikh, Eric N. Tran, Khen Wee

Proceedings of the 23rd IEEE VLSI Test Symposium (VTS 2005), 2005

2004

A Modeling Approach for Addressing Power Supply Switching Noise Related Failures of Integrated Circuit.

Chandra Tirumurti, Sandip Kundu, Susmita Sur-Kolay, Yi-Shing Chang

Proceedings of the 2004 Design, 2004

2003

Test Generation for Maximizing Ground Bounce Considering Circuit Delay.

Yi-Shing Chang, Sandeep K. Gupta, Melvin A. Breuer

Proceedings of the 21st IEEE VLSI Test Symposium (VTS 2003), 27 April, 2003

On Modeling Cross-Talk Faults.

Sujit T. Zachariah, Yi-Shing Chang, Sandip Kundu, Chandra Tirumurti

Proceedings of the 2003 Design, 2003

2001

Test Generation for Maximizing Ground Bounce for Internal Circuitry with Reconvergent Fan-out.

Yi-Shing Chang, Sandeep K. Gupta, Melvin A. Breuer

Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001

1999

Test Generation for Ground Bounce in Internal Logic Circuitry.

Yi-Shing Chang, Sandeep K. Gupta, Melvin A. Breuer

Proceedings of the 17th IEEE VLSI Test Symposium (VTS '99), 1999

1997

Analysis of Ground Bounce in Deep Sub-Micron Circuits.

Yi-Shing Chang, Sandeep K. Gupta, Melvin A. Breuer

Proceedings of the 15th IEEE VLSI Test Symposium (VTS'97), 1997

1992

Design of Concurrent Error-Detectable VLSI-Based Array Dividers.

Thou-Ho Chen, Liang-Gee Chen, Yi-Shing Chang

Proceedings of the Proceedings 1992 IEEE International Conference on Computer Design: VLSI in Computer & Processors, 1992