Yi-qing Zhu

According to our database, Yi-qing Zhu authored at least 1 paper in 2017.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2017

Standard measuring device for thickness of silicon wafer based on laser compensation system.

Yan-hua Zeng, Yun-xia Fu, Dong-mei Tang, Yi-qing Zhu

Proceedings of the 4th International Conference on Systems and Informatics, 2017