Yi-Mu Lee

According to our database, Yi-Mu Lee authored at least 3 papers between 2004 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2024

ESD/Latch-up Immunities Enhancements of HV NLDMOSs by the Embedded Discrete SCR/Schottky Alternating Arrangement Design at the Drain Side.

Xiu-Yuan Yang, Shen-Li Chen, Ting-En Lin, Hung-Wei Chen, Yi-Mu Lee

Proceedings of the International Conference on Consumer Electronics - Taiwan, 2024

Latchup-reliability Impact of High-Voltage nLDMOSs with the Parasitic Schottky Area Modulation in the Source Side.

Ting-En Lin, Shen-Li Chen, Xiu-Yuan Yang, Hung-Wei Chen, Yi-Mu Lee

Proceedings of the International Conference on Consumer Electronics - Taiwan, 2024

2004

Breakdown and reliability of p-MOS devices with stacked RPECVD oxide/nitride gate dielectric under constant voltage stress.

Yi-Mu Lee, Yider Wu, Gerald Lucovsky

Microelectron. Reliab., 2004