Yi Jin

Orcid: 0000-0003-0685-2581

Affiliations:

Beihang University, Beijing, China
Taizhou University, Taizhou, China

According to our database¹, Yi Jin authored at least 5 papers between 2017 and 2024.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of five.

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Bibliography

2024

Cascading Failure Modeling for Circuit Systems Considering Continuous Degradation and Random Shocks Using an Impedance Network.

[BibT_eX]

[DOI]

Yi Jin

Qingyuan Zhang

Symmetry, April, 2024

2023

Cascading failures modeling of electronic circuits with degradation using impedance network.

[BibT_eX]

[DOI]

Reliab. Eng. Syst. Saf., May, 2023

Belief Reliability Evaluation Method Based on Similar Product Information.

[BibT_eX]

[DOI]

Proceedings of the 7th International Conference on System Reliability and Safety, 2023

2021

Cascading Failure Modeling for Circuit Systems Using Impedance Networks: A Current-Flow Redistribution Approach.

[BibT_eX]

[DOI]

IEEE Trans. Ind. Electron., 2021

2017

Coupling damage and reliability modeling for creep and fatigue of solder joint.

[BibT_eX]

[DOI]

Yunxia Chen

Yi Jin

Rui Kang

Microelectron. Reliab., 2017

Yi Jin

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