Yi-Cheng Kung
According to our database1,
Yi-Cheng Kung
authored at least 4 papers
between 2017 and 2020.
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Bibliography
2020
Generating Single- and Double-Pattern Tests for Multiple CMOS Fault Models in One ATPG Run.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020
2018
Proceedings of the IEEE International Test Conference, 2018
Generating Compact Test Patterns for Stuck-at Faults and Transition Faults in One ATPG Run.
Proceedings of the IEEE International Test Conference in Asia, 2018
2017
Proceedings of the 26th IEEE Asian Test Symposium, 2017