Yi Chao Low

According to our database, Yi Chao Low authored at least 1 paper in 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2018

Solving 28 nm I/O circuit reliability issue due to IC design weakness.

Yi Chao Low, Pik Kee Tan, Soon Leng Tan, Yuzhe Zhao, Jeffrey Lam

Microelectron. Reliab., 2018