Ygor Aguiar
Orcid: 0000-0003-4416-2610
According to our database1,
Ygor Aguiar
authored at least 10 papers
between 2016 and 2020.
Collaborative distances:
Collaborative distances:
Timeline
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Online presence:
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Bibliography
2020
Proceedings of the 15th Design & Technology of Integrated Systems in Nanoscale Era, 2020
2018
Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ions.
Microelectron. Reliab., 2018
2017
Microelectron. Reliab., 2017
Evaluation of radiation-induced soft error in majority voters designed in 7 nm FinFET technology.
Microelectron. Reliab., 2017
Radiation sensitivity of XOR topologies in multigate technologies under voltage variability.
Proceedings of the 8th IEEE Latin American Symposium on Circuits & Systems, 2017
Proceedings of the IEEE International Symposium on Circuits and Systems, 2017
Temperature dependence and ZTC bias point evaluation of sub 20nm bulk multigate devices.
Proceedings of the 24th IEEE International Conference on Electronics, Circuits and Systems, 2017
SET response of FinFET-based majority voter circuits under work-function fluctuation.
Proceedings of the 24th IEEE International Conference on Electronics, Circuits and Systems, 2017
2016
Microelectron. Reliab., 2016
Proceedings of the 2016 IEEE International Conference on Electronics, Circuits and Systems, 2016