Yeoh Eng Hong
According to our database1,
Yeoh Eng Hong
authored at least 2 papers
between 1997 and 1998.
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Bibliography
1998
High volume microprocessor test escapes, an analysis of defects our tests are missing.
Proceedings of the Proceedings IEEE International Test Conference 1998, 1998
1997
The Application of Novel Failure Analysis Techniques for Advanced Multi-Layered CMOS Devices.
Proceedings of the Proceedings IEEE International Test Conference 1997, 1997