Yen-Ting Chiang

According to our database, Yen-Ting Chiang authored at least 2 papers between 2008 and 2010.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2010

Improvement of TDDB reliability, characteristics of HfO₂ high-k/metal gate MOSFET device with oxygen post deposition annealing.

Chia-Wei Hsu, Yean-Kuen Fang, Wen-Kuan Yeh, Chun-Yu Chen, Yen-Ting Chiang, Feng-Renn Juang, Chien-Ting Lin, Chieh-Ming Lai

Microelectron. Reliab., 2010

2008

Effect of the pre-gate oxide cleaning temperature on the reliability of GOI and devices performances in deep submicron CMOS technology.

Yen-Ting Chiang, Yean-Kuen Fang, Y. J. Huang, Tse-Heng Chou, S. Y. Yeh, C. S. Lin

Microelectron. Reliab., 2008