Yen-Hsiang Lo
According to our database1,
Yen-Hsiang Lo
authored at least 2 papers
between 2015 and 2017.
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Bibliography
2017
Impact of gate-to-source/drain misalignments on source-side injection Schottky barrier charge-trapping memory cells evaluated using numerical programming-trapping iterations.
Microelectron. Reliab., 2017
2015
Proceedings of the IEEE International Reliability Physics Symposium, 2015