Yeh-Ning Jou

According to our database1, Yeh-Ning Jou authored at least 9 papers between 2008 and 2024.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Links

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Bibliography

2024
Negative Triggering Current Induced the Latch-up in the Circuit without the ESD device to Power.
Proceedings of the International Conference on Consumer Electronics - Taiwan, 2024

2023
Transmission Line Pulse Width Impacting on Device Performances.
Proceedings of the International Conference on Consumer Electronics - Taiwan, 2023

Bipolar Transistors' Holding Phenomena.
Proceedings of the International Conference on Consumer Electronics - Taiwan, 2023

2022
Incorporation of a Simple ESD Circuit in a 650V E-Mode GaN HEMT for All-Terminal ESD Protection.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

Gate Voltages Impacting on Latch-up Measurements.
Proceedings of the IEEE International Conference on Consumer Electronics - Taiwan, 2022

2019
Analyzing Gate-Driven Circuit Parameters for Adding ESD Performances.
Proceedings of the IEEE International Conference on Consumer Electronics - Taiwan, 2019

2015
Impact of guard ring layout on the stacked low-voltage PMOS for high-voltage ESD protection.
Proceedings of the European Conference on Circuit Theory and Design, 2015

2009
Improvement on ESD Robustness of Lateral DMOS in High-voltage CMOS ICs by Body Current Injection.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2009), 2009

2008
Measurement on snapback holding voltage of high-voltage LDMOS for latch-up consideration.
Proceedings of the IEEE Asia Pacific Conference on Circuits and Systems, 2008


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