Yasushi Nakasaki

According to our database, Yasushi Nakasaki authored at least 6 papers between 2013 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2023

Comprehensive Analysis of Hole-Trapping in SiN Films with a Wide Range of Time Constants Based on Dynamic C-V.

Harumi Seki, Reika Ichihara, Yusuke Higashi, Yasushi Nakasaki, Masumi Saitoh, Masamichi Suzuki

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2020

Further Investigation on Mechanism of Trap Level Modulation in Silicon Nitride Films by Fluorine Incorporation.

Harumi Seki, Yasushi Nakasaki, Yuichiro Mitani

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2018

Impact of specific failure mechanisms on endurance improvement for HfO2-based ferroelectric tunnel junction memory.

Marina Yamaguchi, Shosuke Fujii, Yuuichi Kamimuta, Shoichi Kabuyanagi, Tsunehiro Ino, Yasushi Nakasaki, Riichiro Takaishi, Reika Ichihara, Masumi Saitoh

Proceedings of the IEEE International Reliability Physics Symposium, 2018

Study on mechanism of thermal curing in ultra-thin gate dielectrics.

Yuichiro Mitani, Yusuke Higashi, Yasushi Nakasaki

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2017

Mechanism of gate dielectric degradation by hydrogen migration from the cathode interface.

Yusuke Higashi, Riichiro Takaishi, Koichi Kato, Masamichi Suzuki, Yasushi Nakasaki, Mitsuhiro Tomita, Yuichiro Mitani, Masuaki Matsumoto, Shohei Ogura, Katsuyuki Fukutani, Kikuo Yamabe

Microelectron. Reliab., 2017

2013

Time-dependent dielectric breakdown (TDDB) distribution in n-MOSFET with HfSiON gate dielectrics under DC and AC stressing.

Izumi Hirano, Yasushi Nakasaki, Shigeto Fukatsu, Masakazu Goto, Koji Nagatomo, Seiji Inumiya, Katsuyuki Sekine, Yuichiro Mitani, Kikuo Yamabe

Microelectron. Reliab., 2013