Yasushi Azuma

According to our database, Yasushi Azuma authored at least 8 papers between 2007 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2022

Investigating Stability of Si Sphere Surface Layer in Ambient-Vacuum Cyclic Measurements Using Ellipsometry.

Kazuaki Fujita, Kenichi Fujii, Lulu Zhang, Yasushi Azuma, Shigeki Mizushima, Naoki Kuramoto

IEEE Trans. Instrum. Meas., 2022

2021

Reproducibility of the Realization of the Kilogram Based on the Planck Constant by the XRCD Method at NMIJ.

Naoki Kuramoto, Shigeki Mizushima, Lulu Zhang, Kazuaki Fujita, Sho Okubo, Hajime Inaba, Yasushi Azuma, Akira Kurokawa, Yuichi Ota, Kenichi Fujii

IEEE Trans. Instrum. Meas., 2021

2017

Thickness Measurement of Oxide and Carbonaceous Layers on a ²⁸Si Sphere by XPS.

Lulu Zhang, Naoki Kuramoto, Yasushi Azuma, Akira Kurokawa, Kenichi Fujii

IEEE Trans. Instrum. Meas., 2017

Realization of the Kilogram Based on the Planck Constant at NMIJ.

Naoki Kuramoto, Lulu Zhang, Shigeki Mizushima, Kazuaki Fujita, Yasushi Azuma, Akira Kurokawa, Kenichi Fujii

IEEE Trans. Instrum. Meas., 2017

Surface Layer Analysis of a ²⁸Si-Enriched Sphere Both in Vacuum and in Air by Ellipsometry.

Kazuaki Fujita, Naoki Kuramoto, Yasushi Azuma, Shigeki Mizushima, Kenichi Fujii

IEEE Trans. Instrum. Meas., 2017

2015

Surface Layer Analysis of Si Sphere by XRF and XPS.

Lulu Zhang, Yasushi Azuma, Akira Kurokawa, Naoki Kuramoto, Kenichi Fujii

IEEE Trans. Instrum. Meas., 2015

Improvements to the Volume Measurement of ²⁸Si Spheres to Determine the Avogadro Constant.

Naoki Kuramoto, Yasushi Azuma, Hajime Inaba, Feng-Lei Hong, Kenichi Fujii

IEEE Trans. Instrum. Meas., 2015

2007

Density Determination of Silicon Spheres Using an Interferometer With Optical Frequency Tuning.

Naoki Kuramoto, Kenichi Fujii, Yasushi Azuma, Shigeki Mizushima, Yasutake Toyoshima

IEEE Trans. Instrum. Meas., 2007