Yasumi Doi
According to our database1,
Yasumi Doi
authored at least 2 papers
between 2003 and 2005.
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Bibliography
2005
Test compression for scan circuits using scan polarity adjustment and pinpoint test relaxation.
Proceedings of the 2005 Conference on Asia South Pacific Design Automation, 2005
2003
On Combining Pinpoint Test Set Relaxation and Run-Length Codes for Reducing Test Data Volume.
Proceedings of the 21st International Conference on Computer Design (ICCD 2003), 2003