Yashwant K. Malaiya

Proceedings of the 2023 6th International Conference on Information Science and Systems, 2023

2021

Social media analytics of the Internet of Things.

[BibT_eX]

[DOI]

Jim A. Scheibmeir

Discov. Internet Things, 2021

2020

Adaptive Testing Based on Moment Estimation.

[BibT_eX]

[DOI]

IEEE Trans. Syst. Man Cybern. Syst., 2020

2019

Quality Model for Testing Augmented Reality Applications.

[BibT_eX]

[DOI]

Jim A. Scheibmeir

Proceedings of the 10th IEEE Annual Ubiquitous Computing, 2019

An API Development Model for Digital Twins.

[BibT_eX]

[DOI]

Jim A. Scheibmeir

Proceedings of the 19th IEEE International Conference on Software Quality, 2019

2017

Periodicity in software vulnerability discovery, patching and exploitation.

[BibT_eX]

[DOI]

Int. J. Inf. Sec., 2017

2016

Assessing vulnerability exploitability risk using software properties.

[BibT_eX]

[DOI]

Softw. Qual. J., 2016

Evaluating CVSS Base Score Using Vulnerability Rewards Programs.

[BibT_eX]

[DOI]

Proceedings of the ICT Systems Security and Privacy Protection, 2016

To Fear or Not to Fear That is the Question: Code Characteristics of a Vulnerable Functionwith an Existing Exploit.

[BibT_eX]

[DOI]

Proceedings of the Sixth ACM on Conference on Data and Application Security and Privacy, 2016

2015

Comparing and Evaluating CVSS Base Metrics and Microsoft Rating System.

[BibT_eX]

[DOI]

Proceedings of the 2015 IEEE International Conference on Software Quality, 2015

2014

Modeling Skewness in Vulnerability Discovery.

[BibT_eX]

[DOI]

Qual. Reliab. Eng. Int., 2014

Using Software Structure to Predict Vulnerability Exploitation Potential.

[BibT_eX]

[DOI]

Proceedings of the IEEE Eighth International Conference on Software Security and Reliability, 2014

Are the Classical Disaster Recovery Tiers Still Applicable Today?

[BibT_eX]

[DOI]

Proceedings of the 25th IEEE International Symposium on Software Reliability Engineering Workshops, 2014

Using Attack Surface Entry Points and Reachability Analysis to Assess the Risk of Software Vulnerability Exploitability.

[BibT_eX]

[DOI]

Proceedings of the 15th International IEEE Symposium on High-Assurance Systems Engineering, 2014

2012

Assessing Disaster Recovery Alternatives: On-Site, Colocation or Cloud.

[BibT_eX]

[DOI]

Proceedings of the 23rd IEEE International Symposium on Software Reliability Engineering Workshops, 2012

2011

Modeling vulnerability discovery process in Apache and IIS HTTP servers.

[BibT_eX]

[DOI]

Comput. Secur., 2011

2010

Principal Component Analysis-based compensation for measurement errors due to mechanical misalignments in PCB testing.

[BibT_eX]

[DOI]

Proceedings of the 2011 IEEE International Test Conference, 2010

2009

An outlier detection based approach for PCB testing.

[BibT_eX]

[DOI]

Proceedings of the 2009 IEEE International Test Conference, 2009

Seasonal Variation in the Vulnerability Discovery Process.

[BibT_eX]

[DOI]

Proceedings of the Second International Conference on Software Testing Verification and Validation, 2009

2008

Antirandom Testing: A Distance-Based Approach.

[BibT_eX]

[DOI]

VLSI Design, 2008

Application of Vulnerability Discovery Models to Major Operating Systems.

[BibT_eX]

[DOI]

IEEE Trans. Reliab., 2008

Seasonality in Vulnerability Discovery in Major Software Systems.

[BibT_eX]

[DOI]

Proceedings of the 19th International Symposium on Software Reliability Engineering (ISSRE 2008), 2008

Vulnerability Discovery Modeling Using Weibull Distribution.

[BibT_eX]

[DOI]

Jinyoo Kim

Proceedings of the 19th International Symposium on Software Reliability Engineering (ISSRE 2008), 2008

2007

Measuring, analyzing and predicting security vulnerabilities in software systems.

[BibT_eX]

[DOI]

Comput. Secur., 2007

Vulnerability Discovery in Multi-Version Software Systems.

[BibT_eX]

[DOI]

Jinyoo Kim

Indrakshi Ray

Proceedings of the Tenth IEEE International Symposium on High Assurance Systems Engineering (HASE 2007), 2007

2006

X-IDDQ: A Novel Defect Detection Technique Using IDDQ Data.

[BibT_eX]

[DOI]

Ashutosh Sharma

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

Measuring and Enhancing Prediction Capabilities of Vulnerability Discovery Models for Apache and IIS HTTP Servers.

[BibT_eX]

[DOI]

Proceedings of the 17th International Symposium on Software Reliability Engineering (ISSRE 2006), 2006

Assessing Vulnerabilities in Apache and IIS HTTP Servers.

[BibT_eX]

[DOI]

Sung-Whan Woo

Proceedings of the Second International Symposium on Dependable Autonomic and Secure Computing (DASC 2006), 29 September, 2006

Security vulnerability categories in major software systems.

[BibT_eX]

Sung-Whan Woo

Proceedings of the Third IASTED International Conference on Communication, 2006

2005

Modeling the Vulnerability Discovery Process.

[BibT_eX]

[DOI]

Proceedings of the 16th International Symposium on Software Reliability Engineering (ISSRE 2005), 2005

Security Vulnerabilities in Software Systems: A Quantitative Perspective.

[BibT_eX]

[DOI]

Proceedings of the Data and Applications Security XIX, 2005

Dynamic power minimization during combinational circuit testing as a traveling salesman problem.

[BibT_eX]

[DOI]

Proceedings of the IEEE Congress on Evolutionary Computation, 2005

2004

Augmenting Test Case Generation Using Statechart.

[BibT_eX]

Jiao Chen

Proceedings of the International Conference on Software Engineering Research and Practice, 2004

2002

Software reliability growth with test coverage.

[BibT_eX]

[DOI]

IEEE Trans. Reliab., 2002

2000

Module Size Distribution and Defect Density.

[BibT_eX]

[DOI]

Proceedings of the 11th International Symposium on Software Reliability Engineering (ISSRE 2000), 2000

1999

Requirements volatility and defect density.

[BibT_eX]

[DOI]

Proceedings of the 10th International Symposium on Software Reliability Engineering, 1999

1998

Antirandom vs. pseudorandom testing.

[BibT_eX]

[DOI]

Shen Hui Wu

Proceedings of the International Conference on Computer Design: VLSI in Computers and Processors, 1998

Estimating the Number of Residual Defects.

[BibT_eX]

[DOI]

Proceedings of the 3rd IEEE International Symposium on High-Assurance Systems Engineering (HASE '98), 1998

1997

Operational and Test Performance in the Presence of Built-in Current Sensors.

[BibT_eX]

[DOI]

VLSI Design, 1997

Input Pattern Classification for Detection of Stuck-ON and Bridging Faults Using I<sub>DDQ</sub> Testing in BiCMOS and CMOS Circuits.

[BibT_eX]

[DOI]

Proceedings of the 10th International Conference on VLSI Design (VLSI Design 1997), 1997

Automatic test generation using checkpoint encoding and antirandom testing.

[BibT_eX]

[DOI]

Huifang Yin

Zemen Lebne-Dengel

Proceedings of the Eighth International Symposium on Software Reliability Engineering, 1997

What do the software reliability growth model parameters represent?

[BibT_eX]

[DOI]

Proceedings of the Eighth International Symposium on Software Reliability Engineering, 1997

1996

Fault Modeling of ECL for High Fault Coverage of Physical Defects.

[BibT_eX]

[DOI]

VLSI Design, 1996

Fault exposure ratio estimation and applications.

[BibT_eX]

[DOI]

Proceedings of the Seventh International Symposium on Software Reliability Engineering, 1996

Input Pattern Classification for Transistor Level Testing of Bridging Faults in BiCMOS Circuits.

[BibT_eX]

[DOI]

Proceedings of the 6th Great Lakes Symposium on VLSI (GLS-VLSI '96), 1996

1995

Testable design of BiCMOS circuits for stuck-open fault detection using single patterns.

[BibT_eX]

[DOI]

IEEE J. Solid State Circuits, August, 1995

Interconnection of FDDI-II networks through an ATM backbone - An analysis.

[BibT_eX]

[DOI]

Ramanagopal V. Vogety

Proceedings of the Proceedings 20th Conference on Local Computer Networks (LCN'95), 1995

Antirandom testing: getting the most out of black-box testing.

[BibT_eX]

[DOI]

Proceedings of the Sixth International Symposium on Software Reliability Engineering, 1995

ROBUST: a next generation software reliability engineering tool.

[BibT_eX]

[DOI]

Proceedings of the Sixth International Symposium on Software Reliability Engineering, 1995

A Novel High-Speed BiCMOS Domino Logic Family.

[BibT_eX]

[DOI]

Proceedings of the 1995 IEEE International Symposium on Circuits and Systems, ISCAS 1995, Seattle, Washington, USA, April 30, 1995

1994

Resolution Enhancement in I<sub>DDQ</sub> Testing for Large ICs.

[BibT_eX]

[DOI]

VLSI Design, 1994

Input pattern classification for transistor level testing of BiCMOS circuits.

[BibT_eX]

[DOI]

Proceedings of the 12th IEEE VLSI Test Symposium (VTS'94), 1994

The Effect of Built-In Current Sensors (BICS) on Operational and Test Performance.

[BibT_eX]

[DOI]

Proceedings of the Seventh International Conference on VLSI Design, 1994

The relationship between test coverage and reliability.

[BibT_eX]

[DOI]

Proceedings of the 5th International Symposium on Software Reliability Engineering, 1994

On input profile selection for software testing.

[BibT_eX]

[DOI]

Proceedings of the 5th International Symposium on Software Reliability Engineering, 1994

1993

Faulty behavior of storage elements and its effects on sequential circuits.

[BibT_eX]

[DOI]

W. K. Al-Assadi

IEEE Trans. Very Large Scale Integr. Syst., 1993

An Examination of Fault Exposure Ratio.

[BibT_eX]

[DOI]

Anneliese von Mayrhauser

IEEE Trans. Software Eng., 1993

Testable design for BiCMOS stuck-open fault detection.

[BibT_eX]

[DOI]

Proceedings of the 11th IEEE VLSI Test Symposium (VTS'93), 1993

Use of Storage Elements as Primitives for Modelling Faults in Synchronous Sequential Circuits.

[BibT_eX]

[DOI]

W. K. Al-Assadi

Proceedings of the Sixth International Conference on VLSI Design, 1993

The effect of correlated faults on software reliability.

[BibT_eX]

[DOI]

Kang Wu

Proceedings of the Fourth International Symposium on Software Reliability Engineering, 1993

On the need for simulation for better characterization of software reliability.

[BibT_eX]

[DOI]

Anneliese von Mayrhauser

James Keables

Proceedings of the Fourth International Symposium on Software Reliability Engineering, 1993

Enhancing accuracy of software reliability prediction.

[BibT_eX]

[DOI]

Proceedings of the Fourth International Symposium on Software Reliability Engineering, 1993

Test Generation for BiCMOS Circuits.

[BibT_eX]

Proceedings of the 1993 IEEE International Symposium on Circuits and Systems, 1993

1992

Prediction of Software Reliability Using Connectionist Models.

[BibT_eX]

[DOI]

L. Darrell Whitley

IEEE Trans. Software Eng., 1992

Steps to Practical Reliability Meassurement - Guest Editors' Introduction.

[BibT_eX]

[DOI]

IEEE Softw., 1992

Using Neural Networks in Reliability Prediction.

[BibT_eX]

[DOI]

L. Darrell Whitley

IEEE Softw., 1992

Guest Editor's Introduction: VLSI Design 92.

[BibT_eX]

IEEE Des. Test Comput., 1992

Behavior of faulty single BJT BiCMOS logic gates.

[BibT_eX]

[DOI]

Proceedings of the 10th IEEE VLSI Test Symposium (VTS'92), 1992

On Bridging Faults in ECL Circuits.

[BibT_eX]

[DOI]

Proceedings of the Fifth International Conference on VLSI Design, 1992

The nature of fault exposure ratio.

[BibT_eX]

[DOI]

Anneliese von Mayrhauser

Proceedings of the Third International Symposium on Software Reliability Engineering, 1992

The scaling problem in neural networks for software reliability prediction.

[BibT_eX]

[DOI]

Proceedings of the Third International Symposium on Software Reliability Engineering, 1992

1991

Analysis of Detection Capability of Parallel Signature Analyzers.

[BibT_eX]

[DOI]

Yinghua Min

Boping Jin

IEEE Trans. Computers, 1991

An analysis and testing of operation induced faults in MOS VLSI.

[BibT_eX]

[DOI]

Proceedings of the 9th IEEE VLSI Test Symposium (VTS'91), 1991

Enhancement of resolution in supply current based testing for large ICs.

[BibT_eX]

[DOI]

Proceedings of the 9th IEEE VLSI Test Symposium (VTS'91), 1991

Evaluation of detectability in BIST environment.

[BibT_eX]

[DOI]

Sheng Feng

Proceedings of the 9th IEEE VLSI Test Symposium (VTS'91), 1991

Prediction of software reliability using neural networks.

[BibT_eX]

[DOI]

L. Darrell Whitley

Proceedings of the Second International Symposium on Software Reliability Engineering, 1991

Gate level representation of ECL circuits for fault modeling.

[BibT_eX]

[DOI]

Proceedings of the First Great Lakes Symposium on VLSI, 1991

An Introduction to Software Reliability Models.

[BibT_eX]

[DOI]

Proceedings of the 17th International Computer Measurement Group Conference, 1991

1990

On the testing of microprogrammed processor.

[BibT_eX]

[DOI]

Suntae Hwang

Proceedings of the 23rd Annual Workshop and Symposium on Microprogramming and Microarchitecture, 1990

Predictability measures for software reliability models.

[BibT_eX]

[DOI]

Pradeep Verma

Proceedings of the Fourteenth Annual International Computer Software and Applications Conference, 1990

1989

CMOS open-fault detection in the presence of glitches and timing skews.

[BibT_eX]

[DOI]

IEEE J. Solid State Circuits, August, 1989

CMOS stuck-open fault testability.

[BibT_eX]

[DOI]

IEEE J. Solid State Circuits, February, 1989

Limitations of switch level analysis for bridging faults.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1989

On inherent untestability of unaugmented microprogrammed control.

[BibT_eX]

[DOI]

Proceedings of the 22nd Annual Workshop and Symposium on Microprogramming and Microarchitecture, 1989

CMOS Stuck-open Fault Detection Using Single Test Patterns.

[BibT_eX]

[DOI]

Proceedings of the 26th ACM/IEEE Design Automation Conference, 1989

1988

Design of a testable RISC-to-CISC control architecture.

[BibT_eX]

[DOI]

Sheng Feng

Proceedings of the 21st Annual Workshop and Symposium on Microprogramming and Microarchitecture, 1988, San Diego, California, USA, November 28, 1988

1987

On Accuracy of Switch-Level Modeling of Bridging Faults in Complex Gates.

[BibT_eX]

[DOI]

Proceedings of the 24th ACM/IEEE Design Automation Conference. Miami Beach, FL, USA, June 28, 1987

1985

Faults in Microprogrammed and Hardwired Control.

[BibT_eX]

Proceedings of the Proceedings International Test Conference 1985, 1985

1984

Modeling and Testing for Timing Faults in Synchronous Sequential Circuits.

[BibT_eX]

[DOI]

Ramesh Narayanaswamy

IEEE Des. Test, 1984

The Coverage Problem for Random Testing.

[BibT_eX]

Shoubao Yang

Proceedings of the Proceedings International Test Conference 1984, 1984

1983

Testing for Timing Faults in Synchronous Sequential Integrated Circuits.

[BibT_eX]

Ramesh Narayanaswamy

Proceedings of the Proceedings International Test Conference 1983, 1983

1982

A New Fault Model and Testing Technique for CMOS Devices.

[BibT_eX]

Proceedings of the Proceedings International Test Conference 1982, 1982

1981

Reliability Measure of Hardware Redundancy Fault-Tolerant Digital Systems with Intermittent Faults.

[BibT_eX]

[DOI]

IEEE Trans. Computers, 1981

Test-Experiments for Detection and Location of Intermittent Faults in Sequential Circuits.

[BibT_eX]

[DOI]

Chi-Chang Liaw

IEEE Trans. Computers, 1981

State Diagram Approach for Functional Testing of Control Section.

[BibT_eX]

Chi-Chang Liaw

Proceedings of the Proceedings International Test Conference 1981, 1981

1979

A survey of methods for intermittent fault analysis.

[BibT_eX]

[DOI]

Proceedings of the 1979 International Workshop on Managing Requirements Knowledge, 1979

1978

A Continous-Parameter Markov Model and Detection Procedures for Intermittent Faults.

[BibT_eX]

[DOI]

Israel Koren