Yaqing Chi

According to our database, Yaqing Chi authored at least 17 papers between 2010 and 2022.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2022

Implementation of Radiation Hardened Flip-Flops Based on Novel Fishbone Layouts.

Chang Cai, Zehao Wu, Jing Zhang, Luchang Ding, Lei Shen, Jun Yu, Yaqing Chi

Proceedings of the IEEE International Symposium on Circuits and Systems, 2022

2021

Current mirror with charge dissipation transistor for analogue single-event transient mitigation in space application.

Jingtian Liu, Bin Liang, Jianjun Chen, Yaqing Chi, Li Yan, Yang Guo

IET Circuits Devices Syst., 2021

2020

Investigation of Heavy-Ion Induced Single-Event Transient in 28 nm Bulk Inverter Chain.

Anquan Wu, Bin Liang, Yaqing Chi, Zhenyu Wu

Symmetry, 2020

MSIFF: A radiation-hardened flip-flop via interleaving master-slave stage layout topology.

Ruiqiang Song, Jinjin Shao, Bin Liang, Yaqing Chi, Jianjun Chen

IEICE Electron. Express, 2020

Research on the influences of well structure on dose rate effects in 65nm CMOS circuit.

Qian Chen, Jianwei Han, Yingqi Ma, Sai Li, Jingtian Liu, Yaqing Chi, Bin Liang

IEICE Electron. Express, 2020

2019

Supply Voltage and Temperature Dependence of Single-Event Transient in 28-nm FDSOI MOSFETs.

Jingyan Xu, Yang Guo, Ruiqiang Song, Bin Liang, Yaqing Chi

Symmetry, 2019

Characterization of P-hit and N-hit single-event transient using heavy ion microbeam.

Ruiqiang Song, Jinjin Shao, Bin Liang, Yaqing Chi, Jianjun Chen

IEICE Electron. Express, 2019

28nm Fault-Tolerant Hardening-by-Design Frequency Divider for Reducing Soft Errors in Clock and Data Recovery.

Hengzhou Yuan, Yang Guo, Jianjun Chen, Yaqing Chi, Xi Chen, Bin Liang

IEEE Access, 2019

A Single-Event Upset Evaluation Approach Using Ion-Induced Sensitive Area.

Ruiqiang Song, Jinjin Shao, Bin Liang, Yaqing Chi, Jianjun Chen

Proceedings of the 13th IEEE International Conference on ASIC, 2019

2017

Modeling the impact of process and operation variations on the soft error rate of digital circuits.

Ruiqiang Song, Shuming Chen, Bin Liang, Yaqing Chi, Jianjun Chen

Sci. China Inf. Sci., 2017

Comparison of single-event upset generated by heavy ion and pulsed laser.

Bin Liang, Ruiqiang Song, Jianwei Han, Yaqing Chi, Rui Chen, Chunmei Hu, Jianjun Chen, Yingqi Ma, Shipeng Shangguan

Sci. China Inf. Sci., 2017

A Programmable Pre-emphasis Transmitter for SerDes in 40 nm CMOS.

Hongbing Tan, Haiyan Chen, Sheng Liu, Xikun Ma, Yaqing Chi

Proceedings of the Computer Engineering and Technology - 21st CCF Conference, 2017

2014

Research on single-event transient mechanism in a novel SOI CMOS technology.

Chao Zhang, Jianjun Chen, Yaqing Chi, Hui Yang

IEICE Electron. Express, 2014

A low contact resistance graphene field effect transistor with single-layer-channel and multi-layer-contact.

Honghui Sun, Liang Fang, Yao Wang, Yaqing Chi, Rulin Liu

Proceedings of the IEEE/ACM International Symposium on Nanoscale Architectures, 2014

2013

A Scan Chain Based SEU Test Method for Microprocessors.

Yaqing Chi, Yibai He, Bin Liang, Chunmei Hu

Proceedings of the Computer Engineering and Technology - 17th CCF Conference, 2013

2010

Analysis of negative differential conductance of single-island single-electron transistors owing to Coulomb oscillations.

Bingcai Sui, Liang Fang, Yaqing Chi, Chao Zhang

IET Circuits Devices Syst., 2010

Reconfigurable logic gate implemented by suspended-gate single-electron transistors.

Bingcai Sui, Liang Fang, Yaqing Chi

Proceedings of the 5th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, 2010